Journal Of X-ray Science And Technology

Journal Of X-ray Science And Technology

X射线科学与技术杂志

  • 3区 中科院分区
  • Q3 JCR分区

期刊简介

《Journal Of X-ray Science And Technology》是由IOS Press出版社于1989年创办的英文国际期刊(ISSN: 0895-3996,E-ISSN: 1095-9114),该期刊长期致力于仪器仪表领域的创新研究,主要研究方向为工程技术-光学。作为SCIE收录期刊(JCR分区 Q3,中科院 3区),本刊采用OA未开放获取模式(OA占比0%),以发表仪器仪表领域等方向的原创性研究为核心(研究类文章占比100.00%%)。凭借严格的同行评审与高效编辑流程,期刊年载文量精选控制在84篇,确保学术质量与前沿性。成果覆盖Web of Science、Scopus等国际权威数据库,为学者提供推动医学领域高水平交流平台。

投稿咨询

投稿提示

Journal Of X-ray Science And Technology审稿周期约为 约3.0个月 。该刊近年未被列入国际预警名单,年发文量约84篇,录用竞争适中,主题需确保紧密契合医学前沿。投稿策略提示:避开学术会议旺季投稿以缩短周期,语言建议专业润色提升可读性。

  • 医学 大类学科
  • English 出版语言
  • 是否预警
  • SCIE 期刊收录
  • 84 发文量

中科院分区

中科院 SCI 期刊分区 2023年12月升级版

Top期刊 综述期刊 大类学科 小类学科
医学
3区
INSTRUMENTS & INSTRUMENTATION 仪器仪表 OPTICS 光学 PHYSICS, APPLIED 物理:应用
3区 3区 3区

中科院 SCI 期刊分区 2022年12月升级版

Top期刊 综述期刊 大类学科 小类学科
医学
4区
INSTRUMENTS & INSTRUMENTATION 仪器仪表 OPTICS 光学 PHYSICS, APPLIED 物理:应用
4区 4区 4区

JCR分区

按JIF指标学科分区 收录子集 分区 排名 百分位
学科:INSTRUMENTS & INSTRUMENTATION SCIE Q3 44 / 76

42.8%

学科:OPTICS SCIE Q3 73 / 119

39.1%

学科:PHYSICS, APPLIED SCIE Q3 125 / 179

30.4%

按JCI指标学科分区 收录子集 分区 排名 百分位
学科:INSTRUMENTS & INSTRUMENTATION SCIE Q2 35 / 76

54.61%

学科:OPTICS SCIE Q2 59 / 120

51.25%

学科:PHYSICS, APPLIED SCIE Q2 77 / 179

57.26%

CiteScore

CiteScore SJR SNIP CiteScore 排名
CiteScore:4.9 SJR:0.501 SNIP:0.791
学科类别 分区 排名 百分位
大类:Medicine 小类:Radiology, Nuclear Medicine and Imaging Q2 103 / 333

69%

大类:Medicine 小类:Radiation Q2 19 / 58

68%

大类:Medicine 小类:Instrumentation Q2 46 / 141

67%

大类:Medicine 小类:Condensed Matter Physics Q2 141 / 434

67%

大类:Medicine 小类:Electrical and Electronic Engineering Q2 264 / 797

66%

期刊发文

  • Super-resolution image reconstruction from sparsity regularization and deep residual-learned priors

    Author: Zhong, Xinyi; Liang, Ningning; Cai, Ailong; Yu, Xiaohuan; Li, Lei; Yan, Bin

    Journal: JOURNAL OF X-RAY SCIENCE AND TECHNOLOGY. 2023; Vol. 31, Issue 2, pp. 319-336. DOI: 10.3233/XST-221299

  • Mineral quantitative characterization method based on basis material decomposition model by dual-energy computed tomography

    Author: Zhi, Weijuan; Zou, Jing; Zhao, Jintao; Xia, Xiaoqin

    Journal: JOURNAL OF X-RAY SCIENCE AND TECHNOLOGY. 2023; Vol. 31, Issue 2, pp. 373-391. DOI: 10.3233/XST-221324

  • An Innovative Low-dose CT Inpainting Algorithm based on Limited-angle Imaging Inpainting Model

    Author: Zhang, Ziheng; Yang, Minghan; Li, Huijuan; Chen, Shuai; Wang, Jianye; Xu, Lei

    Journal: JOURNAL OF X-RAY SCIENCE AND TECHNOLOGY. 2023; Vol. 31, Issue 1, pp. 131-152. DOI: 10.3233/XST-221260

  • Radiomics nomogram for predicting axillary lymph node metastasis in breast cancer based on DCE-MRI: A multicenter study

    Author: Zhang, Jiwen; Zhang, Zhongsheng; Mao, Ning; Zhang, Haicheng; Gao, Jing; Wang, Bin; Ren, Jianlin; Liu, Xin; Zhang, Binyue; Dou, Tingyao; Li, Wenjuan; Wang, Yanhong; Jia, Hongyan

    Journal: JOURNAL OF X-RAY SCIENCE AND TECHNOLOGY. 2023; Vol. 31, Issue 2, pp. 247-263. DOI: 10.3233/XST-221336

  • Deformable medical image registration based on CNN

    Author: Yang, Yunfeng; Wu, Huihui

    Journal: JOURNAL OF X-RAY SCIENCE AND TECHNOLOGY. 2023; Vol. 31, Issue 1, pp. 85-94. DOI: 10.3233/XST-221252

  • Improving diagnostic performance of rib fractures for the night shift in radiology department using a computer-aided diagnosis system based on deep learning: A clinical retrospective study

    Author: Xiong, Shan; Hu, Hai; Liu, Sibin; Huang, Yuanyi; Cheng, Jianmin; Wan, Bing

    Journal: JOURNAL OF X-RAY SCIENCE AND TECHNOLOGY. 2023; Vol. 31, Issue 2, pp. 265-276. DOI: 10.3233/XST-221343

  • A deep learning-based recognition for dangerous objects imaged in X-ray security inspection device

    Author: Wei, Qiuyue; Ma, Shenlan; Tang, Shaojie; Li, Baolei; Shen, Jiandong; Xu, Yuanfei; Fan, Jiulun

    Journal: JOURNAL OF X-RAY SCIENCE AND TECHNOLOGY. 2023; Vol. 31, Issue 1, pp. 13-26. DOI: 10.3233/XST-221210

  • Skin cancer image recognition based on similarity clustering and attention transfer

    Author: Tan, Zhengbo; Lin, Jiangli; Chen, Ke; Zhuang, Yan; Han, Lin

    Journal: JOURNAL OF X-RAY SCIENCE AND TECHNOLOGY. 2023; Vol. 31, Issue 2, pp. 337-355. DOI: 10.3233/XST-221333