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Fault detection algorithm and application for belt conveyors based on DAS syste
Author: Zhang, Zhixuan; Xia, Zhixin; Wu, Xiaohui; Tan, Zilong; Qi, Yuefeng; Xu, Yunfan
Journal: OPTICAL ENGINEERING. 2026; Vol. 65, Issue 3, pp. 36102-36102. DOI: 10.1117/1.OE.65.3.036102
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Detection of internal defects using continuous wavelet transform and gradient streamlines in dual-channel speckle interferometr
Author: Zhang, Hao; Wang, Kaifu
Journal: OPTICAL ENGINEERING. 2026; Vol. 65, Issue 3, pp. 34103-34103. DOI: 10.1117/1.OE.65.3.034103
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Inverse design of tunable electromagnetically induced transparency terahertz metamaterial antibiotic sensor by improved transforme
Author: Xiao, Binggang; Ma, Zhenyang; Qiu, Wangyang; Lu, Xiaoyan; Yu, Jiabin; Mi, Hongmei; Xiao, Lihua
Journal: OPTICAL ENGINEERING. 2026; Vol. 65, Issue 3, pp. 37101-37101. DOI: 10.1117/1.OE.65.3.037101
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Accurate quantitative gas sensing through UV absorption spectra using a hybrid variational mode decomposition-CNN approac
Author: Xia, Xiaowei; Cai, Haiyang; Fan, Boqiang; Zhuang, Peng; Jiang, Yun; Zhang, Yinian; Miao, Yihan; Kang, Boshi
Journal: OPTICAL ENGINEERING. 2026; Vol. 65, Issue 3, pp. 34110-34110. DOI: 10.1117/1.OE.65.3.034110
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Fabrication and application of high-temperature digital image correlation deformation carriers with high bonding strength via soft imprinting technolog
Author: Wu, Tao; Wang, Puxiang; Xu, Yueyue; Ma, Xiaotong; Zhao, Jinzhao; Li, Jianxi; Liu, Han; Zhou, Jiangfan; Zhang, Hongye; Guo, Baoqiao; Liu, Zhanwei
Journal: OPTICAL ENGINEERING. 2026; Vol. 65, Issue 3, pp. 34106-34106. DOI: 10.1117/1.OE.65.3.034106
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Three-dimensional displacement measurement system based on FMCW self-mixing interferometry and FPGA technolog
Author: Wu, Kedi; Sun, Ruiqian; Xia, Wei; Guo, Dongmei
Journal: OPTICAL ENGINEERING. 2026; Vol. 65, Issue 3, pp. 34104-34104. DOI: 10.1117/1.OE.65.3.034104
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Odd-subcarrier-assisted channel estimation technique for high-order QAM optical universal filtered multi-carrier system
Author: Wang, Fengge; Fei, Yang; Gao, Mingyi; Dan, Yongping
Journal: OPTICAL ENGINEERING. 2026; Vol. 65, Issue 3, pp. 38101-38101. DOI: 10.1117/1.OE.65.3.038101
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Measurement of nano-positioning cross-chamber for Kirkpatrick-Baez mirror and sample stage of synchrotron light sourc
Author: Tang, Shanzhi; Yu, Haihan; Yao, Yihang; He, Tian; Liao, Ruiying; Ou, Zina; Kang, Wenkai; Li, Yang
Journal: OPTICAL ENGINEERING. 2026; Vol. 65, Issue 3, pp. 34101-34101. DOI: 10.1117/1.OE.65.3.034101
