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Preparation method for in situ tensile testing in transmission electron microscopy based on push-to-pull chi
Author: Huang, Rongshen; Liu, Xiao; Fan, Yanchen; Zhang, Hai; Zhou, Jing; Chu, Pan
Journal: ULTRAMICROSCOPY. 2026; Vol. 284, Issue , pp. -. DOI: 10.1016/j.ultramic.2026.114361
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A calculation approach for the virtual source spatial distribution of sub-beams in single-emitter multi-electron-beam system
Author: Hu, Jintao; Ma, Yihao; Yue, Lei; Hu, Hangfeng; Liu, Fu; Kang, Yongfeng
Journal: ULTRAMICROSCOPY. 2026; Vol. 283, Issue , pp. -. DOI: 10.1016/j.ultramic.2026.114356
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The third-order aberrations of magnetic sector analyzer
Author: Li, Meishan; Tao, Hongqing; Hu, Hangfeng; Liu, Fu; Kang, Yongfeng
Journal: ULTRAMICROSCOPY. 2026; Vol. 283, Issue , pp. -. DOI: 10.1016/j.ultramic.2026.114357
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Exploring 4D-STEM in SEM with an event-driven direct electron detector: Low-dose, high-speed, and sparse dat
Author: Liu, Bowen; Hu, Zheng; van Bodegom, Walter; Byelov, Dmitry; Yang, Tianshui; Wang, Yi
Journal: ULTRAMICROSCOPY. 2026; Vol. 283, Issue , pp. -. DOI: 10.1016/j.ultramic.2026.114333
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Suppression of secondary recoil cascade damage in high-Z/low-Z heterostructures: a mechanism-driven FIB strateg
Author: Zhang, Zixuan; Wu, Kai; Jin, Chuanhong
Journal: ULTRAMICROSCOPY. 2026; Vol. 283, Issue , pp. -. DOI: 10.1016/j.ultramic.2026.114349
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A spatial-spectral feature fusion attention residual network for automated bacterial classification via atomic force microscop
Author: Luan, Hao; Wu, Yinan; Bai, Yifan; Wu, Yuting; Chen, He
Journal: ULTRAMICROSCOPY. 2026; Vol. 282, Issue , pp. -. DOI: 10.1016/j.ultramic.2026.114323
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Room-temperature focused ion beam preparation of sensitive organic-inorganic hybrid perovskite
Author: Chen, Yu; Lu, Yuan; Hu, Xiangchen; Chen, Yi; Mi, Qixi; Yu, Yi
Journal: ULTRAMICROSCOPY. 2026; Vol. 282, Issue , pp. -. DOI: 10.1016/j.ultramic.2026.114325
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Automated atomic site determination by four-dimensional scanning transmission electron microscopy data analytic
Author: Fernandez-Canizares, Francisco; Rodriguez-Vazquez, Javier; Ferreira, Rafael, V; Tenreiro, Isabel; Rivera-Calzada, Alberto; Fernando-Saavedra, Amalia; Sanchez-Garcia, Miguel A.; Xie, Yong; Castellanos-Gomez, Andres; Varela, Maria; Sanchez-Santolino, Gabriel
Journal: ULTRAMICROSCOPY. 2026; Vol. 281, Issue , pp. -. DOI: 10.1016/j.ultramic.2025.114303
