| Dr. Probe: A software for high-resolution STEM image simulation |
36 |
| Progress in ultrahigh energy resolution EELS |
18 |
| Robust workflow and instrumentation for cryo-focused ion beam milling of samples for electron cryotomography |
16 |
| Theory of the spatial resolution of (scanning) transmission electron microscopy in liquid water or ice layers |
14 |
| A hybrid genetic-Levenberg Marquardt algorithm for automated spectrometer design optimization |
13 |
| Demonstration of a 2 x 2 programmable phase plate for electrons |
13 |
| The energy dependence of contrast and damage in electron cryomicroscopy of biological molecules |
13 |
| Development of a high brightness ultrafast Transmission Electron Microscope based on a laser-driven cold field emission source |
12 |
| Picometer-scale atom position analysis in annular bright-field STEM imaging |
11 |
| A deep convolutional neural network to analyze position averaged convergent beam electron diffraction patterns |
11 |
| A method for site-specific and cryogenic specimen fabrication of liquid/solid interfaces for atom probe tomography |
11 |
| On the detection of multiple events in atom probe tomography |
11 |
| Direct comparison of off-axis holography and differential phase contrast for the mapping of electric fields in semiconductors by transmission electron microscopy |
10 |
| Comparison of dislocation characterization by electron channeling contrast imaging and cross-correlation electron backscattered diffraction |
10 |
| Femtosecond mega-electron-volt electron microdiffraction |
9 |
| Complementary cathodoluminescence lifetime imaging configurations in a scanning electron microscope |
9 |
| Image registration of low signal-to-noise cryo-STEM data |
9 |
| Progress and prospects of aberration-corrected STEM for functional materials |
9 |
| A spherical harmonic transform approach to the indexing of electron back-scattered diffraction patterns |
9 |
| Theoretical framework of statistical noise in scanning transmission electron microscopy |
9 |
| Stimulated electron energy loss and gain in an electron microscope without a pulsed electron gun |
8 |
| Ewald sphere correction using a single side-band image processing algorithm |
8 |
| Compositional accuracy of atom probe tomography measurements in GaN: Impact of experimental parameters and multiple evaporation events |
8 |
| Towards bend-contour-free dislocation imaging via diffraction contrast STEM |
8 |
| Off-axis electron holography combining summation of hologram series with double-exposure phase-shifting: Theory and application |
8 |
| Imaging properties of hemispherical electrostatic energy analyzers for high resolution momentum microscopy |
8 |
| Advanced detector signal acquisition and electron beam scanning for high resolution SEM imaging |
8 |
| Overcoming the drawbacks of plastic strain estimation based on KAM |
8 |
| A new method for mapping the three-dimensional atomic distribution within nanoparticles by atom probe tomography (APT) |
8 |
| Relative merits and limiting factors for x-ray and electron microscopy of thick, hydrated organic materials |
8 |
| An improved FIB sample preparation technique for site-specific plan-view specimens: A new cutting geometry |
8 |
| Tip wear and tip breakage in high-speed atomic force microscopes |
7 |
| Atomic-scale structure relaxation, chemistry and charge distribution of dislocation cores in SrTiO3 |
7 |
| A systematic comparison of on-axis and off-axis transmission Kikuchi diffraction |
7 |
| 3D reconstruction of the spatial distribution of dislocation loops using an automated stereo-imaging approach |
7 |
| Transmission scanning electron microscopy: Defect observations and image simulations |
7 |
| On the depth resolution of transmission Kikuchi diffraction (TKD) analysis |
7 |
| Time-of-flight secondary ion mass spectrometry in the helium ion microscope |
7 |
| Analysis of discrete local variability and structural covariance in macromolecular assemblies using Cryo-EM and focused classification |
7 |
| Gazing at crystal balls: Electron backscatter diffraction pattern analysis and cross correlation on the sphere |
7 |
| Non-destructive analysis on nano-textured surface of the vertical LED for light enhancement |
7 |
| High quality ultrafast transmission electron microscopy using resonant microwave cavities |
6 |
| Charge accumulation in electron cryomicroscopy |
6 |
| Microscopic charge fluctuations cause minimal contrast loss in cryoEM |
6 |
| In situ electrochemical AFM monitoring of the potential-dependent deterioration of platinum catalyst during potentiodynamic cycling |
6 |
| Spatial dimensions in atomic force microscopy: Instruments, effects, and measurements |
6 |
| Indexing electron backscatter diffraction patterns with a refined template matching approach |
6 |
| Applications of multivariate statistical methods and simulation libraries to analysis of electron backscatter diffraction and transmission Kikuchi diffraction datasets |
6 |
| High dose efficiency atomic resolution imaging via electron ptychography |
6 |
| Application of the pattern matching approach for EBSD calibration and orientation mapping, utilising dynamical EBSP simulations |
6 |
