| Needs, Trends, and Advances in Inorganic Scintillators |
53 |
| Evolution of Total Ionizing Dose Effects in MOS Devices With Moore's Law Scaling |
15 |
| Contribution of Thermal Neutrons to Soft Error Rate |
12 |
| Displacement Damage in Silicon Detectors for High Energy Physics |
11 |
| Improvement of the Time Resolution of Radiation Detectors Based on Gd3Al2Ga3O12 Scintillators With SiPM Readout |
11 |
| Influence of LDD Spacers and H+ Transport on the Total-Ionizing-Dose Response of 65-nm MOSFETs Irradiated to Ultrahigh Doses |
9 |
| LHC and HL-LHC: Present and Future Radiation Environment in the High-Luminosity Collision Points and RHA Implications |
9 |
| Thin Silicon Microdosimeter Utilizing 3-D MEMS Fabrication Technology: Charge Collection Study and Its Application in Mixed Radiation Fields |
9 |
| Luminescence and Scintillation Properties of Novel Disodium Dimolybdate (Na2Mo2O7) Single Crystal |
9 |
| Single-Event Burnout Mechanisms in SiC Power MOSFETs |
8 |
| A 2.56-GHz SEU Radiation Hard LC-Tank VCO for High-Speed Communication Links in 65-nm CMOS Technology |
8 |
| Strategies for Removing Common Mode Failures From TMR Designs Deployed on SRAM FPGAs |
8 |
| Distributed Optical Fiber Radiation Sensing in the Proton Synchrotron Booster at CERN |
8 |
| Current Gain Degradation Model of Displacement Damage for Drift BJTs |
8 |
| Radiation Effects on Deep Submicrometer SRAM-Based FPGAs Under the CERN Mixed-Field Radiation Environment |
7 |
| Capacitance-Frequency Estimates of Border-Trap Densities in Multifin MOS Capacitors |
7 |
| Characterization and Optimization of the Photoneutron Flux Emitted by a 6-or 9-MeV Electron Accelerator for Neutron Interrogation Measurements |
7 |
| Fully Digital and White Rabbit-Synchronized Low-Level RF System for LIPAc |
7 |
| Similarity Analysis on Neutron- and Negative Muon-Induced MCUs in 65-nm Bulk SRAM |
7 |
| Defects and Low-Frequency Noise in Irradiated Black Phosphorus MOSFETs With HfO2 Gate Dielectrics |
7 |
| IBEX: Versatile Readout ASIC With Spectral Imaging Capability and High Count Rate Capability |
6 |
| Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA |
6 |
| Ultrafast Inorganic Scintillators for Gigahertz Hard X-Ray Imaging |
6 |
| Estimating Terrestrial Neutron-Induced SEB Cross Sections and FIT Rates for High-Voltage SiC Power MOSFETs |
6 |
| Application of a LaBr3(Ce) Scintillation Detector to an Environmental Radiation Monitor |
6 |
| Robust Optimal Integral Sliding Mode Controller for Total Power Control of Large PHWRs |
6 |
| Investigations on the Geometry Effects and Bias Configuration on the TID Response of nMOS SOI Tri-Gate Nanowire Field-Effect Transistors |
6 |
| Heavy Ion Radiation Effects on Hafnium Oxide-Based Resistive Random Access Memory |
6 |
| Parameter Estimation for Quantitative Dependability Analysis of Safety-Critical and Control Systems of NPP |
6 |
| Radiation-Induced Attenuation in Single-Mode Phosphosilicate Optical Fibers for Radiation Detection |
6 |
| Single-Event Latch-Up: Increased Sensitivity From Planar to FinFET |
6 |
| Single-Event Burnout of SiC Junction Barrier Schottky Diode High-Voltage Power Devices |
6 |
| Effects of Heavy-Ion Irradiation on Vertical 3-D NAND Flash Memories |
6 |
| Extreme Atmospheric Radiation Environments and Single Event Effects |
6 |
| VUV-Sensitive Silicon Photomultipliers for Xenon Scintillation Light Detection in nEXO |
6 |
| Influence of Halo Implantations on the Total Ionizing Dose Response of 28-nm pMOSFETs Irradiated to Ultrahigh Doses |
6 |
| Dosimetry Techniques and Radiation Test Facilities for Total Ionizing Dose Testing |
5 |
| Total Ionizing Dose Response and Annealing Behavior of Bulk nFinFETs With ON-State Bias Irradiation |
5 |
| Radioluminescence and Optically Stimulated Luminescence Responses of a Cerium-Doped Sol-Gel Silica Glass Under X-Ray Beam Irradiation |
5 |
| Random Telegraph Signal in Proton Irradiated Single-Photon Avalanche Diodes |
5 |
| Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in 65-nm Bulk SRAMs |
5 |
| Impact of Thermal and Intermediate Energy Neutrons on SRAM SEE Rates in the LHC Accelerator |
5 |
| A New Analytical Tool for the Study of Radiation Effects in 3-D Integrated Circuits: Near-Zero Field Magnetoresistance Spectroscopy |
5 |
| On the Efficacy of ECC and the Benefits of FinFET Transistor Layout for GPU Reliability |
5 |
| Ultraenergetic Heavy-Ion Beams in the CERN Accelerator Complex for Radiation Effects Testing |
5 |
| Single-Event Damage Observed in GaN-on-Si HEMTs for Power Control Applications |
5 |
| Design and Status of the Mu2e Crystal Calorimeter |
5 |
| SEE Tests With Ultra Energetic Xe Ion Beam in the CHARM Facility at CERN |
5 |
| Gate Bias and Length Dependences of Total Ionizing Dose Effects in InGaAs FinFETs on Bulk Si |
5 |
| Development of a Very Low-Noise Cryogenic Preamplifier for Large-Area SiPM Devices |
5 |
