Ieee Transactions On Reliability投稿须知

期刊简介

《Ieee Transactions On Reliability》是由Institute of Electrical and Electronics Engineers Inc.出版社于1963年创办的英文国际期刊（ISSN: 0018-9529，E-ISSN: 1558-1721），该期刊长期致力于计算机：硬件领域的创新研究，主要研究方向为工程技术-工程：电子与电气。作为SCIE收录期刊（JCR分区 Q1，中科院 2区），本刊采用OA未开放获取模式（OA占比0%），以发表计算机：硬件领域等方向的原创性研究为核心（研究类文章占比98.48%%）。凭借严格的同行评审与高效编辑流程，期刊年载文量精选控制在132篇，确保学术质量与前沿性。成果覆盖Web of Science、Scopus等国际权威数据库，为学者提供推动计算机科学领域高水平交流平台。

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Ieee Transactions On Reliability审稿周期约为约4.5个月。该刊近年未被列入国际预警名单，年发文量约132篇，录用竞争适中，主题需确保紧密契合计算机科学前沿。投稿策略提示：避开学术会议旺季投稿以缩短周期，语言建议专业润色提升可读性。

计算机科学 大类学科
English 出版语言
否是否预警
SCIE 期刊收录
132 发文量

中科院分区

中科院 SCI 期刊分区 2023年12月升级版

Top期刊	综述期刊	大类学科	小类学科
否	否	计算机科学 2区	COMPUTER SCIENCE, HARDWARE & ARCHITECTURE 计算机：硬件 COMPUTER SCIENCE, SOFTWARE ENGINEERING 计算机：软件工程 ENGINEERING, ELECTRICAL & ELECTRONIC 工程：电子与电气 2区 2区 2区

中科院 SCI 期刊分区 2022年12月升级版

Top期刊	综述期刊	大类学科	小类学科
否	否	计算机科学 2区	COMPUTER SCIENCE, HARDWARE & ARCHITECTURE 计算机：硬件 COMPUTER SCIENCE, SOFTWARE ENGINEERING 计算机：软件工程 ENGINEERING, ELECTRICAL & ELECTRONIC 工程：电子与电气 2区 2区 2区

JCR分区

按JIF指标学科分区	收录子集	分区	排名	百分位
学科：COMPUTER SCIENCE, HARDWARE & ARCHITECTURE	SCIE	Q1	8 / 59	87.3%
学科：COMPUTER SCIENCE, SOFTWARE ENGINEERING	SCIE	Q1	13 / 131	90.5%
学科：ENGINEERING, ELECTRICAL & ELECTRONIC	SCIE	Q1	65 / 352	81.7%

按JCI指标学科分区	收录子集	分区	排名	百分位
学科：COMPUTER SCIENCE, HARDWARE & ARCHITECTURE	SCIE	Q1	7 / 59	88.98%
学科：COMPUTER SCIENCE, SOFTWARE ENGINEERING	SCIE	Q1	14 / 131	89.69%
学科：ENGINEERING, ELECTRICAL & ELECTRONIC	SCIE	Q1	42 / 354	88.28%

CiteScore

SJR

SNIP

CiteScore 排名

CiteScore：12.2

SJR：1.511

SNIP：1.989

学科类别	分区	排名	百分位
大类：Engineering 小类：Safety, Risk, Reliability and Quality	Q1	7 / 207	96%
大类：Engineering 小类：Electrical and Electronic Engineering	Q1	57 / 797	92%

期刊发文

Novel Discriminant Locality Preserving Projection Integrated With Monte Carlo Sampling for Fault Diagnosis
Author: He, Yan-Lin; Li, Kun; Liang, Li-Long; Xu, Yuan; Zhu, Qun-Xiong

Journal: IEEE TRANSACTIONS ON RELIABILITY. 2023; Vol. 72, Issue 1, pp. 166-176. DOI: 10.1109/TR.2021.3115108
Fault Diagnosability of Networks With Fault-Free Block at Local Vertex Under MM* Model
Author: Huang, Yanze; Lin, Limei; Lin, Yuhang; Xu, Li; Hsieh, Sun-Yuan

Journal: IEEE TRANSACTIONS ON RELIABILITY. 2023; Vol. 72, Issue 1, pp. 372-383. DOI: 10.1109/TR.2021.3129257
Improved Locality Preserving Projections Based on Heat-Kernel and Cosine Weights for Fault Classification in Complex Industrial Processes
Author: Zhang, Ning; Xu, Yuan; Zhu, Qun-Xiong; He, Yan-Lin

Journal: IEEE TRANSACTIONS ON RELIABILITY. 2023; Vol. 72, Issue 1, pp. 204-213. DOI: 10.1109/TR.2021.3139539
Resilience Enhancement for Multistate Interdependent Infrastructure Networks: From a Preparedness Perspective
Author: Wang, Kai; Xu, Zhaoping; Liu, Yu; Fang, Yiping

Journal: IEEE TRANSACTIONS ON RELIABILITY. 2023; Vol. 72, Issue 1, pp. 190-203. DOI: 10.1109/TR.2021.3132774
SeTransformer: A Transformer-Based Code Semantic Parser for Code Comment Generation
Author: Li, Zheng; Wu, Yonghao; Peng, Bin; Chen, Xiang; Sun, Zeyu; Liu, Yong; Paul, Doyle

Journal: IEEE TRANSACTIONS ON RELIABILITY. 2023; Vol. 72, Issue 1, pp. 258-273. DOI: 10.1109/TR.2022.3154773
Reliability of a Distributed Data Storage System Considering the External Impacts
Author: Kou, Gang; Yi, Kunxiang; Xiao, Hui; Peng, Rui

Journal: IEEE TRANSACTIONS ON RELIABILITY. 2023; Vol. 72, Issue 1, pp. 3-14. DOI: 10.1109/TR.2022.3161638
Reliability Modeling and Assessment for a Cyber-Physical System With a Complex Boundary Behavior
Author: Gong, Hongfang; Li, Renfa; An, Jiyao; Xie, Guoqi

Journal: IEEE TRANSACTIONS ON RELIABILITY. 2023; Vol. 72, Issue 1, pp. 224-239. DOI: 10.1109/TR.2022.3160460
An Intelligent Resource Management Solution for Hospital Information System Based on Cloud Computing Platform
Author: Gong, Siqian; Zhu, Xiaomin; Zhang, Runtong; Zhao, Hongmei; Guo, Chao

Journal: IEEE TRANSACTIONS ON RELIABILITY. 2023; Vol. 72, Issue 1, pp. 329-342. DOI: 10.1109/TR.2022.3161359

Ieee Transactions On Reliability

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期刊简介

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中科院分区

JCR分区

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