International Journal Of Numerical Modelling-electronic Networks Devices And Fie

International Journal Of Numerical Modelling-electronic Networks Devices And Fie

国际数值建模杂志-电子网络设备与技术

  • 4区 中科院分区
  • Q3 JCR分区

期刊简介

《International Journal Of Numerical Modelling-electronic Networks Devices And Fie》是由John Wiley and Sons Ltd出版社于1988年创办的英文国际期刊(ISSN: 0894-3370,E-ISSN: 1099-1204),该期刊长期致力于工程:电子与电气领域的创新研究,主要研究方向为工程技术-工程:电子与电气。作为SCIE收录期刊(JCR分区 Q3,中科院 4区),本刊采用OA未开放获取模式(OA占比0.0234...%),以发表工程:电子与电气领域等方向的原创性研究为核心(研究类文章占比99.05%%)。凭借严格的同行评审与高效编辑流程,期刊年载文量精选控制在105篇,确保学术质量与前沿性。成果覆盖Web of Science、Scopus等国际权威数据库,为学者提供推动工程技术领域高水平交流平台。

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投稿提示

International Journal Of Numerical Modelling-electronic Networks Devices And Fie审稿周期约为 12周,或约稿 。该刊近年未被列入国际预警名单,年发文量约105篇,录用竞争适中,主题需确保紧密契合工程技术前沿。投稿策略提示:避开学术会议旺季投稿以缩短周期,语言建议专业润色提升可读性。

  • 工程技术 大类学科
  • English 出版语言
  • 是否预警
  • SCIE 期刊收录
  • 105 发文量

中科院分区

中科院 SCI 期刊分区 2023年12月升级版

Top期刊 综述期刊 大类学科 小类学科
工程技术
4区
ENGINEERING, ELECTRICAL & ELECTRONIC 工程:电子与电气 MATHEMATICS, INTERDISCIPLINARY APPLICATIONS 数学跨学科应用
4区 4区

中科院 SCI 期刊分区 2022年12月升级版

Top期刊 综述期刊 大类学科 小类学科
工程技术
4区
ENGINEERING, ELECTRICAL & ELECTRONIC 工程:电子与电气 MATHEMATICS, INTERDISCIPLINARY APPLICATIONS 数学跨学科应用
4区 4区

JCR分区

按JIF指标学科分区 收录子集 分区 排名 百分位
学科:ENGINEERING, ELECTRICAL & ELECTRONIC SCIE Q3 239 / 352

32.2%

学科:MATHEMATICS, INTERDISCIPLINARY APPLICATIONS SCIE Q3 70 / 135

48.5%

按JCI指标学科分区 收录子集 分区 排名 百分位
学科:ENGINEERING, ELECTRICAL & ELECTRONIC SCIE Q3 200 / 354

43.64%

学科:MATHEMATICS, INTERDISCIPLINARY APPLICATIONS SCIE Q3 82 / 135

39.63%

CiteScore

CiteScore SJR SNIP CiteScore 排名
CiteScore:4.6 SJR:0.43 SNIP:0.682
学科类别 分区 排名 百分位
大类:Mathematics 小类:Modeling and Simulation Q2 86 / 324

73%

大类:Mathematics 小类:Electrical and Electronic Engineering Q2 290 / 797

63%

大类:Mathematics 小类:Computer Science Applications Q2 342 / 817

58%

期刊发文

  • The investigation of the signal radiation mechanism of different GSG-pads connection methods

    Author: Song, Zelin; Liu, Huihua; Mawuli, Ernest Smith; Yu, Yiming; Zhao, Chenxi; Wu, Yunqiu; Tang, Hongyan; Kang, Kai

    Journal: INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS. 2023; Vol. 36, Issue 1, pp. -. DOI: 10.1002/jnm.3026

  • AlGaN-based solar-blind avalanche photodetectors with gradually doped charge layer

    Author: Yao, Yufei; Jiang, Xuecheng; Gu, Yan; Yang, Guofeng; Wei, Chunlei; Xie, Zhijian; Zhang, Qi; Qian, Weiying; Zhu, Chun

    Journal: INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS. 2023; Vol. 36, Issue 1, pp. -. DOI: 10.1002/jnm.3028

  • A noise circulating VCO with an intrinsic injection locking tripler

    Author: Xing, Zhao; Liu, Huihua; Wu, Yunqiu; Zhao, Chenxi; Yu, Yiming; Kang, Kai

    Journal: INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS. 2023; Vol. 36, Issue 1, pp. -. DOI: 10.1002/jnm.3037

  • Mutual inductance model of double printed circuit board-based coplanar rectangular spiral coils for eddy-current testing

    Author: Wu, Dehui; Lin, Shibin; Chen, Hongfu; Wang, Xiaohong

    Journal: INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS. 2023; Vol. 36, Issue 1, pp. -. DOI: 10.1002/jnm.3038

  • ICN-FDTD scheme with absorption boundary condition for nonuniform rotational symmetric geometrics

    Author: Wu, Shihong; Dong, Yunyun; Liu, Lining; Su, Feng; Chen, Xiangguang

    Journal: INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS. 2023; Vol. 36, Issue 2, pp. -. DOI: 10.1002/jnm.3057

  • Design and optimization of a fault-tolerant demultiplexer based on nano-scale quantum-dots

    Author: Xu, Aiqin; Wu, Jing; Zhou, Guoliang

    Journal: INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS. 2023; Vol. , Issue , pp. -. DOI: 10.1002/jnm.3087

  • Automatic design of microwave filters by using relational induction neural networks

    Author: Dai, Xi Wang; Hu, Wen Hao; Fu, Yang Hui; Liu, Jie; Chen, Zhi Xi

    Journal: INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS. 2023; Vol. , Issue , pp. -. DOI: 10.1002/jnm.3102

  • Statistical analysis of phased arrays with random excitation errors using a unified neural network architecture

    Author: Zhao, Yunru; Wu, Qi

    Journal: INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS. 2023; Vol. , Issue , pp. -. DOI: 10.1002/jnm.3104