Microelectronics International

Microelectronics International

微电子国际

  • 4区 中科院分区
  • Q4 JCR分区

期刊简介

《Microelectronics International》是由Emerald Group Publishing Ltd.出版社于1982年创办的英文国际期刊(ISSN: 1356-5362,E-ISSN: 1758-812X),该期刊长期致力于工程:电子与电气领域的创新研究,主要研究方向为工程技术-材料科学:综合。作为SCIE收录期刊(JCR分区 Q4,中科院 4区),本刊采用OA混合获取模式(OA占比0%),以发表工程:电子与电气领域等方向的原创性研究为核心(研究类文章占比100.00%%)。凭借严格的同行评审与高效编辑流程,期刊年载文量精选控制在30篇,确保学术质量与前沿性。成果覆盖Web of Science、Scopus等国际权威数据库,为学者提供推动工程技术领域高水平交流平台。

投稿咨询

投稿提示

Microelectronics International审稿周期约为 12周,或约稿 。该刊近年未被列入国际预警名单,年发文量约30篇,录用竞争适中,主题需确保紧密契合工程技术前沿。投稿策略提示:避开学术会议旺季投稿以缩短周期,语言建议专业润色提升可读性。

  • 工程技术 大类学科
  • English 出版语言
  • 是否预警
  • SCIE 期刊收录
  • 30 发文量

中科院分区

中科院 SCI 期刊分区 2023年12月升级版

Top期刊 综述期刊 大类学科 小类学科
工程技术
4区
ENGINEERING, ELECTRICAL & ELECTRONIC 工程:电子与电气 MATERIALS SCIENCE, MULTIDISCIPLINARY 材料科学:综合
4区 4区

中科院 SCI 期刊分区 2022年12月升级版

Top期刊 综述期刊 大类学科 小类学科
工程技术
4区
ENGINEERING, ELECTRICAL & ELECTRONIC 工程:电子与电气
4区

JCR分区

按JIF指标学科分区 收录子集 分区 排名 百分位
学科:ENGINEERING, ELECTRICAL & ELECTRONIC SCIE Q4 308 / 352

12.6%

学科:MATERIALS SCIENCE, MULTIDISCIPLINARY SCIE Q4 399 / 438

9%

按JCI指标学科分区 收录子集 分区 排名 百分位
学科:ENGINEERING, ELECTRICAL & ELECTRONIC SCIE Q4 314 / 354

11.44%

学科:MATERIALS SCIENCE, MULTIDISCIPLINARY SCIE Q4 383 / 438

12.67%

CiteScore

CiteScore SJR SNIP CiteScore 排名
CiteScore:1.9 SJR:0.188 SNIP:0.354
学科类别 分区 排名 百分位
大类:Engineering 小类:Electrical and Electronic Engineering Q3 511 / 797

35%

大类:Engineering 小类:Surfaces, Coatings and Films Q3 90 / 132

31%

大类:Engineering 小类:Electronic, Optical and Magnetic Materials Q3 201 / 284

29%

大类:Engineering 小类:Condensed Matter Physics Q3 308 / 434

29%

大类:Engineering 小类:Atomic and Molecular Physics, and Optics Q3 163 / 224

27%

期刊发文

  • Experimental study on the fracture behavior variation of the Au stud bump bonding with different high temperature storage times

    Author: Zhang, Xiangou; Wang, Yuexing; Sun, Xiangyu; Deng, Zejia; Pu, Yingdong; Zhang, Ping; Huang, Zhiyong; Zhou, Quanfeng

    Journal: MICROELECTRONICS INTERNATIONAL. 2023; Vol. , Issue , pp. -. DOI: 10.1108/MI-12-2022-0203

  • Au-coated Ag alloy bonding wires with enhanced oxidation resistance for electronic packaging applications

    Author: Xiao, Yuchen; Tang, Huiyi; Zhang, Hehe; Yang, Xiaoling; Sun, Ling; Xie, Yong; Wu, Baoan; Luan, Baifeng; Xie, Weidong; Cai, Xinnan

    Journal: MICROELECTRONICS INTERNATIONAL. 2023; Vol. 40, Issue 2, pp. 96-103. DOI: 10.1108/MI-08-2022-0158

  • Effects of Co-60 gamma ray radiation on the transmission characteristics of interconnection structures for 3D packaging

    Author: Zhang, Youxin; Liu, Yang; Gao, Rongxing; Zeng, Xianghua; Xue, Yuxiong

    Journal: MICROELECTRONICS INTERNATIONAL. 2023; Vol. 40, Issue 2, pp. 109-114. DOI: 10.1108/MI-07-2022-0120

  • W-band antenna in package module with hybrid glass-compound WLFO process

    Author: Wang, Gang; Xia, Chenhui; Wang, Bo; Zhao, Xinran; Li, Yang; Yang, Ning

    Journal: MICROELECTRONICS INTERNATIONAL. 2023; Vol. 40, Issue 2, pp. 104-108. DOI: 10.1108/MI-06-2022-0111

  • Magnetic alignment technology for wafer bonding

    Author: Ye, Lezhi; Song, Xuanjie; Yue, Chang

    Journal: MICROELECTRONICS INTERNATIONAL. 2023; Vol. , Issue , pp. -. DOI: 10.1108/MI-08-2022-0160

  • Recent progress on bumpless Cu/SiO2 hybrid bonding for 3D heterogeneous integration

    Author: Li, Ge; Kang, Qiushi; Niu, Fanfan; Wang, Chenxi

    Journal: MICROELECTRONICS INTERNATIONAL. 2023; Vol. 40, Issue 2, pp. 115-131. DOI: 10.1108/MI-07-2022-0121

  • Effects of interface cracks on reliability of surface mount technology interconnection in service environment

    Author: Liu, Shaoyi; Yao, Songjie; Xue, Song; Wang, Benben; Jin, Hui; Pan, Chenghui; Zhang, Yinwei; Zhou, Yijiang; Zeng, Rui; Ping, Lihao; Min, Zhixian; Zhang, Daxing; Wang, Congsi

    Journal: MICROELECTRONICS INTERNATIONAL. 2023; Vol. 40, Issue 2, pp. 140-151. DOI: 10.1108/MI-10-2022-0183

  • Facile ligand-exchange strategy to promote low-temperature nano-sintering of oleylamine-capped Ag nanoparticles

    Author: Li, Liyun; Zhang, Yu; Xia, Shiyu; Sun, Zhefei; Yuan, Junjie; Su, Dongchuan; Cao, Hunjun; Chai, Xiaoming; Wang, Qingtian; Li, Jintang; Zhang, Zhihao

    Journal: MICROELECTRONICS INTERNATIONAL. 2023; Vol. 40, Issue 2, pp. 132-139. DOI: 10.1108/MI-11-2022-0186