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A DVFS Design and Simulation Framework Using Machine Learning Models
Author: Zhuo, Cheng; Gao, Di; Cao, Yuan; Shen, Tianhao; Zhang, Li; Zhou, Jinfang; Yin, Xunzhao
Journal: IEEE DESIGN & TEST. 2023; Vol. 40, Issue 1, pp. 52-61. DOI: 10.1109/MDAT.2021.3119279
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Fully Microstrip Three-Port Circuit Bandpass NGD Design and Test
Author: Ravelo, Blaise; Douyere, Alexandre; Liu, Yang; Rahajandraibe, Wenceslas; Wan, Fayu; Chan, George; Guerin, Mathieu
Journal: IEEE DESIGN & TEST. 2023; Vol. 40, Issue 1, pp. 96-104. DOI: 10.1109/MDAT.2022.3164337
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Machine Learning in Advanced IC Design: A Methodological Survey
Author: Chen, Tinghuan; Zhang, Grace Li; Yu, Bei; Li, Bing; Schlichtmann, Ulf
Journal: IEEE DESIGN & TEST. 2023; Vol. 40, Issue 1, pp. 17-33. DOI: 10.1109/MDAT.2022.3216799
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Topology-Aided Multicorner Timing Predictor for Wide Voltage Design
Author: Cao, Peng; Yang, Tai; Wang, Kai; Bao, Wei; Yan, Hao
Journal: IEEE DESIGN & TEST. 2023; Vol. 40, Issue 1, pp. 62-69. DOI: 10.1109/MDAT.2021.3117745
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Multiplication Circuit Architecture for Error- Tolerant CNN-Based Keywords Speech Recognition
Author: Liu, Bo; Cai, Hao; Zhang, Zilong; Ding, Xiaoling; Zhang, Renyuan; Gong, Yu; Wang, Zhen; Ge, Wei; Yang, Jun
Journal: IEEE DESIGN & TEST. 2023; Vol. 40, Issue 3, pp. 26-35. DOI: 10.1109/MDAT.2021.3135346
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Dependable STT-MRAM With Emerging Approximation and Speculation Paradigms
Author: Cai, Hao; Hou, Yaoru; Zhang, Mengdi; Liu, Bo; Naviner, Lirida Alves de Barros
Journal: IEEE DESIGN & TEST. 2023; Vol. 40, Issue 3, pp. 17-25. DOI: 10.1109/MDAT.2021.3120330
