Ieee Design & Test

Ieee Design & Test

IEEE设计与测试

  • 4区 中科院分区
  • Q3 JCR分区

发文分析

近年文章引用他刊数据

文章名称 引用次数
Edge Intelligence-On the Challenging Road to a Trillion ... 8
ZeNA: Zero-Aware Neural Network Accelerator 7
Context-Aware Intelligence in Resource Constrained loT N... 7
Hierarchical Electric Vehicle Charging Aggregator Strate... 7
A Survey on Security Threats and Countermeasures in IEEE... 6
Survey of Automotive Controller Area Network Intrusion D... 5
Voltage-Driven Building Block for Hardware Belief Networ... 5
Quantum Computing Circuits and Devices 5
Design-for-Testability of On-Chip Control in mVLSI Bioch... 5
CPU-FPGA Coscheduling for Big Data Applications 4

近年被他刊引用数据

期刊名称 引用次数
IEEE ACCESS 57
IEEE T COMPUT AID D 52
IEEE T VLSI SYST 38
INTEGRATION 35
J ELECTRON TEST 29
ACM T DES AUTOMAT EL 25
IEEE T COMPUT 21
IEEE DES TEST 16
IEEE T CIRCUITS-I 15
MICROPROCESS MICROSY 15