发文分析
近年国家/地区发文量统计
| 国家/地区 | 数量 |
|---|---|
| USA | 83 |
| South Korea | 40 |
| CHINA MAINLAND | 38 |
| Japan | 29 |
| Taiwan | 25 |
| GERMANY (FED REP GER) | 15 |
| Belgium | 6 |
| India | 6 |
| Netherlands | 6 |
| Singapore | 6 |
近年机构发文量统计
| 机构 | 数量 |
|---|---|
| SAMSUNG | 14 |
| GLOBALFOUNDRIES | 11 |
| SAMSUNG ELECTRONICS | 10 |
| KOREA ADVANCED INSTITUTE OF SCIENCE & TECHNOLO... | 8 |
| UNIVERSITY OF NORTH CAROLINA | 8 |
| INTEL CORPORATION | 7 |
| NATIONAL TSING HUA UNIVERSITY | 7 |
| SKYWORKS SOLUT INC | 7 |
| ASML HOLDING | 6 |
| IMEC | 6 |
近年文章引用他刊数据
| 文章名称 | 引用次数 |
|---|---|
| Wafer Map Defect Pattern Classification and Image Retrie... | 41 |
| Classification of Mixed-Type Defect Patterns in Wafer Bi... | 24 |
| Hybrid Particle Swarm Optimization Combined With Genetic... | 23 |
| Convolutional Neural Network for Wafer Surface Defect Cl... | 22 |
| AdaBalGAN: An Improved Generative Adversarial Network Wi... | 15 |
| A Voting Ensemble Classifier for Wafer Map Defect Patter... | 15 |
| Epitaxial beta-Ga2O3 and beta-(AlxGa1-x)(2)O-3/beta-Ga2O... | 15 |
| Decision Tree Ensemble-Based Wafer Map Failure Pattern R... | 13 |
| A Data Driven Cycle Time Prediction With Feature Selecti... | 12 |
| Deep-Structured Machine Learning Model for the Recogniti... | 12 |
近年被他刊引用数据
| 期刊名称 | 引用次数 |
|---|---|
| IEEE T SEMICONDUCT M | 182 |
| IEEE T AUTOM SCI ENG | 79 |
| IEEE ACCESS | 48 |
| ECS J SOLID STATE SC | 33 |
| COMPUT IND ENG | 24 |
| INT J PROD RES | 20 |
| J MANUF SYST | 17 |
| COMPUT IND | 16 |
| IEEE T ELECTRON DEV | 16 |
| INT J ADV MANUF TECH | 16 |