| Wafer Map Defect Pattern Classification and Image Retrieval Using Convolutional Neural Network |
41 |
| Classification of Mixed-Type Defect Patterns in Wafer Bin Maps Using Convolutional Neural Networks |
24 |
| Hybrid Particle Swarm Optimization Combined With Genetic Operators for Flexible Job-Shop Scheduling Under Uncertain Processing Time for Semiconductor Manufacturing |
23 |
| Convolutional Neural Network for Wafer Surface Defect Classification and the Detection of Unknown Defect Class |
22 |
| AdaBalGAN: An Improved Generative Adversarial Network With Imbalanced Learning for Wafer Defective Pattern Recognition |
15 |
| A Voting Ensemble Classifier for Wafer Map Defect Patterns Identification in Semiconductor Manufacturing |
15 |
| Epitaxial beta-Ga2O3 and beta-(AlxGa1-x)(2)O-3/beta-Ga2O3 Heterostructures Growth for Power Electronics |
15 |
| Decision Tree Ensemble-Based Wafer Map Failure Pattern Recognition Based on Radon Transform-Based Features |
13 |
| A Data Driven Cycle Time Prediction With Feature Selection in a Semiconductor Wafer Fabrication System |
12 |
| Deep-Structured Machine Learning Model for the Recognition of Mixed-Defect Patterns in Semiconductor Fabrication Processes |
12 |
| On-Chip Adaptive Body Bias for Reducing the Impact of NBTI on 6T SRAM Cells |
11 |
| Anomaly Detection and Segmentation for Wafer Defect Patterns Using Deep Convolutional Encoder-Decoder Neural Network Architectures in Semiconductor Manufacturing |
10 |
| A Computer Vision-Inspired Deep Learning Architecture for Virtual Metrology Modeling With 2-Dimensional Datale |
9 |
| Transfer-Learning-Based Online Mura Defect Classification |
8 |
| Fault Detection and Diagnosis Using Self-Attentive Convolutional Neural Networks for Variable-Length Sensor Data in Semiconductor Manufacturing |
8 |
| A Novel DBSCAN-Based Defect Pattern Detection and Classification Framework for Wafer Bin Map |
8 |
| Development of Large Diameter Semi-Insulating Gallium Oxide (Ga2O3) Substrates |
7 |
| Compact Analytical Model to Extract Write Static Noise Margin (WSNM) for SRAM Cell at 45-nm and 65-nm Nodes |
7 |
| Improved Normalized Cross-Correlation for Defect Detection in Printed-Circuit Boards |
6 |
| Temperature Dependent Electrical Transport Properties of High Carrier Mobility Reduced Graphene Oxide Thin Film Devices |
6 |
| Just-In-Time Modeling With Variable Shrinkage Based on Gaussian Processes for Semiconductor Manufacturing |
6 |
| Fault Detection Strategy Based on Weighted Distance of k Nearest Neighbors for Semiconductor Manufacturing Processes |
5 |
| On Effectiveness of Transfer Learning Approach for Neural Network-Based Virtual Metrology Modeling |
4 |
| Efficient Approach to Cyclic Scheduling of Single-Arm Cluster Tools With Chamber Cleaning Operations and Wafer Residency Time Constraint |
4 |
| Extreme Temperature Operation of Ultra-Wide Bandgap AlGaN High Electron Mobility Transistors |
4 |
| Feature Extraction From Analog Wafermaps: A Comparison of Classical Image Processing and a Deep Generative Model |
4 |
| Scheduling of Dual Resource Constrained Lithography Production: Using CP and MIP/CP |
4 |
| Making Use of Manufacturing Process Variations: A Dopingless Transistor Based-PUF for Hardware-Assisted Security |
4 |
| The Design and Implementation of an Embedded Real-Time Automated IC Marking Inspection System |
4 |
| Photoelectrochemical Etching Technology for Gallium Nitride Power and RF Devices |
3 |
| Denoised Residual Trace Analysis for Monitoring Semiconductor Process Faults |
3 |
| Enhanced Stacked Denoising Autoencoder-Based Feature Learning for Recognition of Wafer Map Defects |
3 |
| Clustering the Dominant Defective Patterns in Semiconductor Wafer Maps |
3 |
| Moisture Prevention in a Pre-Purged Front-Opening Unified Pod (FOUP) During Door Opening in a Mini-Environment |
3 |
| An Optimal Design Methodology for Yield-Improved and Low-Power Pipelined ADC |
2 |
| Wafer Map Defect Pattern Recognition Using Rotation-Invariant Features |
2 |
| Development of the Virtual Metrology for the Nitride Thickness in Multi-Layer Plasma-Enhanced Chemical Vapor Deposition Using Plasma-Information Variables |
2 |
| Study on the Wear Characteristics of a Lapping Wheel in Double-Sided Lapping Based on the Trajectory Distribution |
2 |
| An Efficient and High Quality Chemical Mechanical Polishing Method for Copper Surface in 3D TSV Integration |
2 |
| Job Dispatch Control for Production Lines With Overlapped Time Window Constraints |
2 |
| Development of Novel Solar Cell Micro Crack Detection Technique |
2 |
| Real-Time Measurement of Exact Size and Refractive Index of Particles in Liquid by Flow Particle Tracking Method |
2 |
| A CNN-Based Transfer Learning Method for Defect Classification in Semiconductor Manufacturing |
2 |
| An Integrated Approach for IC Design R&D Portfolio Decision and Project Scheduling and a Case Study |
2 |
| An Online Virtual Metrology Model With Sample Selection for the Tracking of Dynamic Manufacturing Processes With Slow Drift |
2 |
| Wafer Defect Pattern Recognition and Analysis Based on Convolutional Neural Network |
2 |
| Effect of Large Particles During Chemical Mechanical Polishing Based on Numerical Modeling of Abrasive Particle Trajectories and Material Removal Non-Uniformity |
2 |
| An Improved GMM-Based Algorithm With Optima Multi-Color Subspaces for Color Difference Classification of Solar Cells |
2 |
| Practical Routing Algorithm Using a Congestion Monitoring System in Semiconductor Manufacturing |
2 |
| Wafer Level Variability Improvement by Spatial Source/Drain Activation and Ion Implantation Super Scan for FinFET Technology |
2 |
