Journal Of Electron Spectroscopy And Related Phenomena

Journal Of Electron Spectroscopy And Related Phenomena

电子能谱及相关现象杂志

  • 4区 中科院分区
  • Q2 JCR分区

期刊简介

《Journal Of Electron Spectroscopy And Related Phenomena》是由Elsevier出版社于1972年创办的英文国际期刊(ISSN: 0368-2048,E-ISSN: 1873-2526),该期刊长期致力于光谱学领域的创新研究,主要研究方向为物理-光谱学。作为SCIE收录期刊(JCR分区 Q2,中科院 4区),本刊采用OA未开放获取模式(OA占比0.0653...%),以发表光谱学领域等方向的原创性研究为核心(研究类文章占比98.65%%)。凭借严格的同行评审与高效编辑流程,期刊年载文量精选控制在74篇,确保学术质量与前沿性。成果覆盖Web of Science、Scopus等国际权威数据库,为学者提供推动物理与天体物理领域高水平交流平台。

投稿咨询

投稿提示

Journal Of Electron Spectroscopy And Related Phenomena审稿周期约为 较慢,6-12周 。该刊近年未被列入国际预警名单,年发文量约74篇,录用竞争适中,主题需确保紧密契合物理与天体物理前沿。投稿策略提示:避开学术会议旺季投稿以缩短周期,语言建议专业润色提升可读性。

  • 物理与天体物理 大类学科
  • Multi-Language 出版语言
  • 是否预警
  • SCIE 期刊收录
  • 74 发文量

中科院分区

中科院 SCI 期刊分区 2023年12月升级版

Top期刊 综述期刊 大类学科 小类学科
物理与天体物理
4区
SPECTROSCOPY 光谱学
3区

中科院 SCI 期刊分区 2022年12月升级版

Top期刊 综述期刊 大类学科 小类学科
物理与天体物理
3区
SPECTROSCOPY 光谱学
3区

JCR分区

按JIF指标学科分区 收录子集 分区 排名 百分位
学科:SPECTROSCOPY SCIE Q2 22 / 44

51.1%

按JCI指标学科分区 收录子集 分区 排名 百分位
学科:SPECTROSCOPY SCIE Q2 16 / 44

64.77%

CiteScore

CiteScore SJR SNIP CiteScore 排名
CiteScore:3.3 SJR:0.506 SNIP:0.68
学科类别 分区 排名 百分位
大类:Physics and Astronomy 小类:Radiation Q2 26 / 58

56%

大类:Physics and Astronomy 小类:Atomic and Molecular Physics, and Optics Q3 116 / 224

48%

大类:Physics and Astronomy 小类:Condensed Matter Physics Q3 227 / 434

47%

大类:Physics and Astronomy 小类:Electronic, Optical and Magnetic Materials Q3 158 / 284

44%

大类:Physics and Astronomy 小类:Physical and Theoretical Chemistry Q3 115 / 189

39%

大类:Physics and Astronomy 小类:Spectroscopy Q3 49 / 76

36%

期刊发文

  • Theoretical studies of the spectral characteristics and electron impact dynamics of Ti XXI placed in the hot dense regimes

    Author: Chen, Z. B.; Zhao, G. P.; Qi, Y. Y.

    Journal: JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. 2023; Vol. 262, Issue , pp. -. DOI: 10.1016/j.elspec.2022.147283

  • Stable attosecond beamline equipped with high resolution electron and XUV spectrometer based on high-harmonics generation

    Author: Li, Mingxuan; Wang, Huiyong; Li, Xiaokai; Wang, Jun; Zhang, Jieda; San, Xinyue; Ma, Pan; Lu, Yongnan; Liu, Zhang; Wang, Chuncheng; Yang, Yujun; Luo, Sizuo; Ding, Dajun

    Journal: JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. 2023; Vol. 263, Issue , pp. -. DOI: 10.1016/j.elspec.2023.147287

  • Al/Si dopants effect on the electronic and optical behaviors of graphene mono-layers useful for infrared detector devices

    Author: Hussein, Z.; Khan, W.; Laref, A.; Alqahtani, H. R.; Booq, Z. I. Y.; Alsalamah, R.; Ahmed, A.; Nya, Fridolin Tchangnwa; Chowdhury, Shahariar; Monir, Mohammed El Amine; Kumar, Atul; Huang, H. M.; Xiong, Y. C.; Yang, J. T.

    Journal: JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. 2023; Vol. 264, Issue , pp. -. DOI: 10.1016/j.elspec.2023.147296

  • Single-atom cobalt-incorporating carbon nitride for photocatalytic solar hydrogen conversion: An X-ray spectromicroscopy study

    Author: Huang, Yu-Cheng; Chen, Jie; Lu, Ying-Rui; Arul, K. Thanigai; Ohigashi, Takuji; Chen, Jeng-Lung; Chen, Chi-Liang; Shen, Shaohua; Chou, Wu-Ching; Pong, Way-Faung; Dong, Chung-Li

    Journal: JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. 2023; Vol. 264, Issue , pp. -. DOI: 10.1016/j.elspec.2023.147319

  • State-selective quantum interference studied in the photo-recombination of Ar17+ ion

    Author: Kun Ma, Zhan-Bin Chen, Lu-You Xie, Chen-Zhong Dong, Hai-Jiang Lv, Zheng Jiao, Feng-Jian Jiang

    Journal: JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2019, Vol., , DOI:10.1016/j.elspec.2019.01.004

  • Hyperfine structure and 2s-2p transition in C-like Fe, Co and Ni

    Author: Cui-Cui Sang, Zhan-Bin Chen, Yan Sun, Xiao-Zhi Shen, Feng Hu, Jun Ma, Xiang-Li Wang

    Journal: JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2018, Vol.230, 26-32, DOI:10.1016/j.elspec.2018.11.001

  • Thermal and light induced surface instability of perovskite films in the photoelectron spectroscopy measurement

    Author: Si Chen, Xiang Du, Dongxu Lin, Fangyan Xie, Weiguang Xie, Li Gong, Weihong Zhang, Pengyi Liu, Jian Chen

    Journal: JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2018, Vol.229, 108-113, DOI:10.1016/j.elspec.2018.10.007

  • Analysis of SiOx layers for silicon heterojunction solar cells

    Author: Jieyu Bian, Liping Zhang, Fanying Meng, Zhengxin Liu

    Journal: JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2017, Vol.218, 46-50, DOI:10.1016/j.elspec.2017.06.001