发文分析
近年国家/地区发文量统计
| 国家/地区 | 数量 |
|---|---|
| USA | 39 |
| CHINA MAINLAND | 31 |
| GERMANY (FED REP GER) | 30 |
| India | 28 |
| Japan | 26 |
| Italy | 19 |
| Russia | 15 |
| Sweden | 15 |
| France | 13 |
| Poland | 12 |
近年机构发文量统计
| 机构 | 数量 |
|---|---|
| UNITED STATES DEPARTMENT OF ENERGY (DOE) | 12 |
| CHINESE ACADEMY OF SCIENCES | 11 |
| CONSIGLIO NAZIONALE DELLE RICERCHE (CNR) | 9 |
| TECHNISCHE UNIVERSITAT WIEN | 9 |
| CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (... | 8 |
| HELMHOLTZ ASSOCIATION | 8 |
| UPPSALA UNIVERSITY | 8 |
| CZECH ACADEMY OF SCIENCES | 7 |
| HUNAN UNIVERSITY OF TECHNOLOGY | 7 |
| UNIVERSITY OF DELHI | 7 |
近年文章引用他刊数据
| 文章名称 | 引用次数 |
|---|---|
| XPS in industry-Problems with binding energies in journa... | 15 |
| Chemical bonding in carbide MXene nanosheets | 14 |
| Chemical surface analysis on materials and devices under... | 11 |
| Imaging XPS for industrial applications | 10 |
| Automated electron-optical system optimization through s... | 10 |
| Electronic and magnetic properties of the (001) surface ... | 9 |
| Reliable absorbance measurement of liquid samples in sof... | 9 |
| Electronic properties of composite iron (II, III) oxide ... | 8 |
| Investigation of local geometrical structure, electronic... | 6 |
| Effect of argon sputtering on XPS depth-profiling result... | 6 |
近年被他刊引用数据
| 期刊名称 | 引用次数 |
|---|---|
| J PHYS CHEM C | 181 |
| PHYS REV B | 154 |
| J CHEM PHYS | 151 |
| PHYS CHEM CHEM PHYS | 151 |
| J ELECTRON SPECTROSC | 148 |
| APPL SURF SCI | 139 |
| ACS APPL MATER INTER | 89 |
| PHYS REV A | 79 |
| J PHYS CHEM A | 69 |
| SURF INTERFACE ANAL | 64 |