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A method for series resistance extraction in advanced MOSFET
Author: Yan, Yu; Dou, Cunhua; Zhang, Xuan; Song, Weijia; Tang, Zhiyu; Li, Binhong; Wan, Jing; Sun, Huabin; Zhao, Xing; Wang, Yun; Xu, Yong; Cristoloveanu, Sorin
Journal: SOLID-STATE ELECTRONICS. 2026; Vol. 235, Issue , pp. -. DOI: 10.1016/j.sse.2026.109360
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Investigation on pulse repetition frequency characteristics of 4H-Silicon carbide drift step recovery diod
Author: Liu, Tong; Liang, Lin; Wen, Kaijun
Journal: SOLID-STATE ELECTRONICS. 2026; Vol. 234, Issue , pp. -. DOI: 10.1016/j.sse.2026.109354
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Investigation of cap layer effects on low-contact-resistance vanadium-based Au-free low-temperature ohmic contacts for AlGaN/GaN HEM
Author: Xie, Zijing; Ma, Xiao; Li, Xinghuan; Tang, Jun; Wang, Hong
Journal: SOLID-STATE ELECTRONICS. 2026; Vol. 234, Issue , pp. -. DOI: 10.1016/j.sse.2026.109351
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Bonding of micro LEDs using wet reflow process of indium bumps based on SU-8 solder mas
Author: Bai, Shuangjia; Lang, Taifu; Lin, Xin; Wang, Shuaishuai; Wang, Zhihua; Lin, Chang; Yan, Qun; Sun, Jie
Journal: SOLID-STATE ELECTRONICS. 2026; Vol. 234, Issue , pp. -. DOI: 10.1016/j.sse.2026.109333
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Investigation of performance enhancement in high-efficiency organic light-emitting device based on a bipolar hos
Author: Wu, Lishuang; Xu, Huiwen; Zhang, Jinghong; Wang, Chandong; Wu, Zhijun; Yang, Huishan
Journal: SOLID-STATE ELECTRONICS. 2025; Vol. 229, Issue , pp. -. DOI: 10.1016/j.sse.2025.109160
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Influence of N-type substrate's bias potential on electrical characteristics of 4H-SiC integrated devices for All-SiC IC
Author: Li, Yongjia; Zheng, Guiqiang; Ma, Jie; Gu, Yong; Wei, Jiaxing; Li, Sheng; Zhang, Long; Liu, Siyang; Sun, Weifeng
Journal: SOLID-STATE ELECTRONICS. 2025; Vol. 229, Issue , pp. -. DOI: 10.1016/j.sse.2025.109155
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Characteristics evaluation of reverse blocking diode thyristor for DC circuit breake
Author: Qing, Zhengheng; Liang, Lin; Xu, Mosai
Journal: SOLID-STATE ELECTRONICS. 2025; Vol. 229, Issue , pp. -. DOI: 10.1016/j.sse.2025.109163
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Model of threshold voltage and drain current in core-shell junctionless transistor on FD-SO
Author: Dou, Cunhua; Song, Weijia; Yan, Yu; Zhang, Xuan; Tang, Zhiyu; Li, Binhong; Xu, Yong; Cristoloveanu, Sorin
Journal: SOLID-STATE ELECTRONICS. 2025; Vol. 229, Issue , pp. -. DOI: 10.1016/j.sse.2025.109173