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A Layout-Based Rad-Hard DICE Flip-Flop Design
Author: Haibin Wang, Xixi Dai, Younis Mohammed Younis Ibrahim, Hongwen Sun, Issam Nofal, Li Cai, Gang Guo, Zicai Shen, Li Chen
Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2019, Vol., , DOI:10.1007/s10836-019-05773-4
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A Semantics-based Translation Method for Automated Verification of SystemC TLM Designs
Author: Yanyan Gao, Xi Li
Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2013, Vol.29, 685-695, DOI:10.1007/s10836-013-5406-8
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Efficient Test Compression Technique for SoC Based on Block Merging and Eight Coding
Author: Tie-Bin Wu, Heng-Zhu Liu, Peng-Xia Liu
Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2013, Vol.29, 849-859, DOI:10.1007/s10836-013-5415-7
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An Approximate Calculation of Ratio of Normal Variables and Its Application in Analog Circuit Fault Diagnosis
Author: Yongcai Ao, Yibing Shi, Wei Zhang, Yanjun Li
Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2013, Vol.29, 555-565, DOI:10.1007/s10836-013-5382-z
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Observation-Oriented ATPG and Scan Chain Disabling for Capture Power Reduction
Author: Lung-Jen Lee
Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2013, Vol.29, 625-634, DOI:10.1007/s10836-013-5404-x
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Prognostics of Analog Filters Based on Particle Filters Using Frequency Features
Author: Min Li, Weiming Xian, Bing Long, Houjun Wang
Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2013, Vol.29, 567-584, DOI:10.1007/s10836-013-5383-y
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A Novel Compact Model for On-Chip Vertically-Coiled Spiral Inductors
Author: Bing Hou, Tong Liu, Jun Liu, Junli Chen, Faxin Yu, Wenbo Wang
Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2016, Vol.32, 649-652, DOI:10.1007/s10836-016-5613-1
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Layout-based Single Event Mitigation Techniques for Dynamic Logic Circuits
Author: Haibin Wang, Mulong Li, Xixi Dai, Shuting Shi, Li Chen, Gang Guo
Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2015, Vol.32, 97-103, DOI:10.1007/s10836-015-5559-8
