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Dynamic Meta-Learning with Attentional Prototypes for Few-Shot Wafer Defect Recognitio
Author: Ni, Tianming; Yu, Meifang; Chen, Xiaofei; Liang, Huaguo; Wang, Senling; Cheng, Muyang; Nie, Mu
Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS. 2026; Vol. , Issue , pp. -. DOI: 10.1007/s10836-026-06224-7
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Study on Analysis and Troubleshooting Methods for Common Faults of a Certain Type of On-board Recorde
Author: Wang, Ning; Fan, Xiang; Zhou, Zhenquan; Zheng, Lihong
Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS. 2026; Vol. , Issue , pp. -. DOI: 10.1007/s10836-026-06230-9
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ResNeSt Wafer Map Defect Pattern Recognition Based on the Multi-attention Mechanism and Enhanced Activation Functio
Author: Chen, Shouhong; Han, Lingfeng; Wei, Cong; Zhu, Ziren; Hou, Xingna; Guo, Ling
Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS. 2026; Vol. , Issue , pp. -. DOI: 10.1007/s10836-026-06229-2
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An Efficient Cybersecurity Method to Detect Phishing Attacks Integrating Heuristic-Driven Feature Optimizer and Deep Learning Algorithm
Author: Li, Shaoju; Bouyer, Asgarali; Arasteh, Bahman
Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS. 2026; Vol. , Issue , pp. -. DOI: 10.1007/s10836-026-06233-6
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SAF-YOLO: a Semantic-Aware Lightweight Framework for Fine-Grained PCB Defect Detectio
Author: Du, Xianjun; Wang, Jingxiang
Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS. 2026; Vol. , Issue , pp. -. DOI: 10.1007/s10836-026-06220-x
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SRAM PUF Preselection Method Based on Neighboring Spatial Majority Votin
Author: Shi, Tianyao; Chen, Sining; Chen, Haijin
Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS. 2026; Vol. , Issue , pp. -. DOI: 10.1007/s10836-025-06214-1
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Average Relative SNR: New Metric to Evaluate the Attack Performance of Non-Profiled Side-Channel Trace
Author: Tang, Cheng; Li, Lang
Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS. 2026; Vol. , Issue , pp. -. DOI: 10.1007/s10836-026-06218-5
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PN-SCA: A High Generalization and Fast Profiled SCA Based on Prototypical Network
Author: Ou, Yu; Wei, Yongzhuang; Ou, Changhai; Pasalic, Enes
Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS. 2026; Vol. , Issue , pp. -. DOI: 10.1007/s10836-026-06219-4
