Journal Of Electronic Testing-theory And Applications

Journal Of Electronic Testing-theory And Applications

电子测试理论与应用杂志

  • 4区 中科院分区
  • Q4 JCR分区

发文分析

近年文章引用他刊数据

文章名称 引用次数
Machine Learning for Hardware Security: Opportunities an... 10
Security Analysis of the Efficient Chaos Pseudo-random N... 6
Single Event Transient Propagation Probabilities Analysi... 5
Test and Reliability in Approximate Computing 5
An Extensible Code for Correcting Multiple Cell Upset in... 4
Impact of Aging on the Reliability of Delay PUFs 3
Hardware Trojan Detection Using an Advised Genetic Algor... 3
Test Generation for Bridging Faults in Reversible Circui... 3
A Low-Cost Test Solution for Reliable Communication in N... 3
The Fundamental Primitives with Fault-Tolerance in Quant... 3

近年被他刊引用数据

期刊名称 引用次数
J ELECTRON TEST 30
IEEE ACCESS 21
IEEE T COMPUT AID D 16
ANALOG INTEGR CIRC S 11
IEEE T VLSI SYST 10
IET COMPUT DIGIT TEC 9
MICROELECTRON J 9
SENSORS-BASEL 9
MICROELECTRON RELIAB 8
INTEGRATION 7